Facility for Analysis, Characterisation, Testing and Simulation (FACTS)

Location: N4.1-B4-1

Its role is to provide research support and advanced facilities for staff, postgraduate and undergraduate students in the areas of electron microscopy and microanalysis, as well as x-ray diffraction analysis.

This central facility is also open to scientists and engineers from the National University of Singapore, private companies and A*Star research institutes. Basic training on the Transmission Electron Microscope (TEM), X-Ray Diffractometer (XRD), Scanning Electron Microscope (SEM) is provided.

Please click here for the list of equipment.