Advanced Transmission Electron Microscopy of Microstructure-Property Relationships in Magnetic Materials and Semiconductor Devices by Professor Rafal E. Dunin-Borkowski
MSE Distinguished Speaker Series 2026 Hosted by Assistant Professor Prashant Kumar
Abstract
The transmission electron microscope is a powerful instrument for measuring not only local variations in microstructure and composition in materials, but also their functional properties. In particular, electron optical phase contrast techniques can be used to provide quantitative information about local variations in magnetic field and electrostatic potential in materials with nanometer to atomic spatial resolution, both in projection and in three dimensions. In this talk, I will illustrate how the technique of off-axis electron holography can be used to provide unique insight into microstructure-property relationships in nanoscale magnetic materials and semiconductor devices. Such measurements can be performed in the presence of external stimuli such as magnetic field, voltage, reduced or elevated temperature, reactive gas and light. I will conclude the talk with a report on progress in the installation and commissioning of five next-generation electron microscope platforms in the Ernst Ruska-Centre in Forschungszentrum Jülich, as well as on plans for a European Distributed Research Infrastructure for Advanced Electron Microscopy.
Biography

Professor Rafal E. Dunin-Borkowski
Ernst Ruska-Centre for Microscopy and Spectroscopy with Electrons
Forschungszentrum Jülich, Germany