Facility Usage Charges
Use of FACTS instruments is subject to the charges shown below.
Note that the standard rate covers only a small portion of the total cost of running, maintaining and training users on our state of the art equipment.
Notes:
- Charging applies to all research staff and students.
- NUS users will be charged at the same rate as NTU users in line with the recent announcement.
- Charges below do not include Goods and Services Tax (GST).
- Office hours are 8 am - 6 pm Monday to Friday, excluding public holidays.
- Rates after office hours are 50% of office hour rates.
- Undergraduates are allowed to operate the thermionic SEMs and XRD cluster 1.
- Undergraduates are only allowed to use XRD cluster 2 after approval.
- Samples should be submitted to the person in charge of the instrument for analysis. Charges will be incurred.
- There is a minimum 1 hour usage charge for SEM/XRD and 2 hours for TEM/FIB.
- For urgent bookings please contact us. A 100% extra charge will be imposed.
- For usage with assistance, the charges are for the technical operation of our instruments and do not include data analysis nor any guarantee of results.
- Charges will still apply if users cancel their booking less than 24 hours before their session or fail to turn up for their booked session. Please cancel sessions as soon as you know you are unable to use them to allow others to use the instrument.
- Non-NTU users can only use the instruments with technical assistance from our scientists and will be charged at the usage with assistance rate.
- For NTU users who require more information, please email us at facts@ntu.edu.sg, including full details of your samples.
- For non-NTU company/industry requests please email us at facts-external@ntu.edu.sg for a quote.
Hourly rates for instrument use
Rates in S$/hour. Updated 8th July 2026
| NTU Standard rate (Self operation) | NTU (Usage with assistance) | Other academic institutions (Usage with assistance) | |
| TEM Cluster | |||
| TEM F200 | 80 | 275 | 413 |
| TEM 2100F / TEM 2200FS | 70 | 268 | 402 |
| TEM 2010 | 52 | 250 | 375 |
| Aberration-Corrected TEM Cluster | |||
| ACTEM JEOL ARM200F/ARM300F | 120** | 428 | 642 |
| Focused Ion Beam | |||
| Zeiss Crossbeam 540 FIB | 80 | 219 | 328 |
| Helios 5 Ga-FIB | 120 | 259 | 389 |
| Hydra PFIB | 150 | 289 | 434 |
| Field-Emission SEM Cluster | |||
| FESEM 7800F PRIME with LV and EBSD | 46 | 178 | 267 |
| FESEM 7600F | 40 | 172 | 258 |
| FESEM 6340F | 30 | 162 | 243 |
| E-beam lithography system | 12 | - | - |
| Thermo Scientific Quattro S with EDAX WDS/EDS | 55 | 187 | 281 |
| Thermionic SEM Cluster | |||
Thermionic-SEM 6360/5500LV/5410 | 20 | 152 | 228 |
| XRD Cluster 1 | |||
XRD Shimadzu | 20 | 130 | 195 |
| XRD Cluster 2 | |||
| XRD Bruker D8 Advance / XRD Rigaku Miniflex 6000 | 22 | 132 | 198 |
| XRD Cluster 3 | |||
| Bruker D8 Discover HR-XRD / Rigaku SmartLab 3kW XSPA / Rigaku SmartLab 3kW HyPix | 25 | 157 | 236 |
Rigaku SmartLab 9 kW XRD | 50 | 182 | 273 |
| Small-Wide Angle X-ray Scattering | |||
| SWAXS Anton-Paar SAXSess | 15 | 147 | 221 |
| SWAXS Xenocs Nano-inXider | 40 | 172 | 258 |
| Microanalysis & Surface techniques | |||
| EPMA JEOL JXA-8530F | 30 | 201 | 301 |
| XPS Kratos AXIS Supra | 90 | 170 | 391 |
Scanning Auger AES JAMP-7830F | 60 | 231 | 346 |
| XRF S8 Tiger | 60 | 231 | 346 |
| Specimen Preparation Cluster (no assistance) | |||
| PIPS | 6 | | |
| Ultramicrotome | 10 | | |
| Cryo-ultramicrotome | 20 | | |
| Disc cutter & grinder | 3 | | |
| Dimpler | 3 | | |
| Cryoplunger | 30 | | |
| Training | |||
| TEM 2100F | | 460 | |
| TEM 2010 | | 460 | |
| ACTEM ARM300F/ARM200F | | 2,700 | |
| Cryo-TEM | | 460 | per day |
| Zeiss FIB*** | | 1,240 | FIB training includes 4h free usage within 2 months |
| Helios 5 Ga-FIB*** | | 1,610 | |
| Hydra PFIB FIB*** | | 1,800 | |
| FE-SEM cluster (including FESEM 6340F and FESEM 7600F/7800F) | | 400 | |
| FE-SEM 7800F EBSD | | 100 | |
| E-beam lithography (on FESEM 7600F) | | 120 | |
| Thermionic SEM cluster | | 250 | |
| XRD cluster 1 | | 60 | |
| XRD cluster 2 | | 230 | |
| XRD cluster 3 | | 300 | |
| XPS | | 1,380 | per training session |
| XRF | | 400 | |
| Specimen Prep (PIPS, Dimpler, Disc Cutter & Grinder) | | 120 | |
| Specimen Prep (Ultramicrotome) | | 250 | |
| Specimen Prep (Cryoplunger) | | 200 | |
** 25% discount for aberration corrected TEM for the period up to 31 October 2026
*** FIB training:
There are discounted conversion rates for experienced Zeiss users and for combined Helios 5 Ga-FIB plus Hydra PFIB training.
Charges are for the basic operation of the FIB. Specialised techniques such as cathodoluminescence, EBSD, ToF SIMS, tomography and cryo transfer will require extra training at rates of S$180–200/h.
Extra training days when required will be charged at S$460–700/day.