The study of the structure, properties, behaviour and processing of materials and their applications in engineering is conducted at atomic scale both as a means of materials optimisation and materials discovery. Atomic level crystallographic, structural and chemical analysis using electron and X-ray probes provides an essential underpinning for the design, development and validation of nanomaterials.
Electron spectroscopy for chemical analysis (ESCA) for surface chemical analysis of materials. Applications: XPS, AES.
Scanning electron microscope (SEM) for high resolution imaging and chemical analysis of micro- and nano-structures. Applications: FESEM, WDX-EDX, E-SEM, EPMA, EBSD
Advanced transmission electrons microscopes (TEM) for high-resolution imaging and chemical analysis of atoms and biological samples. Applications: HRTEM, ACTEM, Cryo-TEM
We are NTU's shared facility, specialising in Electron Microscopy, X-ray Diffraction and Surface Analysis.
New to FACTS?
Users are welcome to consult our staff scientists for further advice on their characterisation work, and undergo instrument training to work on their own samples.
Please acknowledge our facility in any scientific publication or oral presentation where the data presented are collected from our instruments or with the help of FACTS’s staff.