Course detailsCourse description

Introduction to X-ray Diffraction (XRD) and Analysis

Instructor: Samuel Morris

06 Oct 2021 (Wed), 10:00 AM - 12:00 PM

Lecture Theatre at The Arc (LHN-LT)

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This introductory course to X-ray Diffraction will cover the basics of the crystalline state, the theory of how X-rays interact with crystalline matter and how to run an X-ray diffraction experiment with a few tips and tricks. The talk will be split up into two 45-minute sessions, by the end of which you will be able to take your crystalline powder, obtain an X-ray diffraction pattern and understand the basics of how to analyse it.

This talk will be given by Dr. Samuel A. Morris, who currently runs the single-crystal diffractometer in FACTS while researching novel applications and structures of porous materials, focusing on variable-temperature, -gaseous environments and –electric potential in-situ cells for diffraction techniques.

Introduction to Scanning Electron Microscopy (SEM)

Instructor: Derrick Ang

06 Oct 2021 (Wed), 01:00 PM - 02:30 PM

Lecture Theatre at The Arc (LHN-LT)

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This short course aims to introduce potential users to the basics of SEM, its capabilities, and its limitations. By developing a theoretical understanding of the technique, it is hoped that new users will learn more quickly, work more efficiently, and maximize the capabilities of these instruments to excel further in their research.

Introduction to Transmission Electron Microscopy (TEM)

Instructor: Chris Boothroyd

13 Oct 2021 (Wed), 10:00 AM - 11:30 AM

Lecture Theatre at The Arc (LHN-LT)

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Transmission electron microscopy can give information about the structure, chemical composition and many other parameters of a sample at resolutions down to the atomic scale. This course will provide an introduction to how TEM works and what the different TEM techniques are useful for. The basic (and some not so basic) theory of electron scattering in materials will be covered. A more advanced course will follow later in the year.

On the use of characteristic X-rays for elemental analysis of materials: An introduction to the related techniques of X-ray Fluorescence (XRF) and Electron Probe Microanalysis (EPMA)

Instructors: Jason Herrin & Samuel Morris

13 Oct 2021 (Wed), 01:00 PM - 02:30 PM

Lecture Theatre at The Arc (LHN-LT)

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We will give a brief introduction to elemental quantitative analysis using XRF and EPMA. Talking about the advantages, disadvantages and complimentary of the techniques, including sample requirements, accuracy vs statistics and application strategies.

Probing at the nanoscale using Small and Wide Angle X-ray Scattering (SAXS/WAXS) technique

Instructor: Pio Buenconsejo

28 Oct 2021 (Thu), 02:00 PM - 04:00 PM

TELS room at AToM@FACTS ABN

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Small angle X-ray scattering (SAXS) is used to study the structure of a material at length scales in the nanometer range to investigate size, shape, order, orientation and distribution. Wide angle X-ray scattering (WAXS) on the other hand captures the interatomic distances at the sub-nanometer range shedding light on the atomic ordering and/or crystallinity of the material. This course will introduce new users to the basic principles of SAXS/WAXS, transmission and grazing incident experiments, data analysis and some examples related to materials science research.

 

 

Title and other detailsCourse description

Transmission Electron Microscope (TEM) Sample Preparation

Level:  Current and potential TEM users

Instructor: Tay Yee Yan (FACTS)

19 May 2021, 9:30 - 11:30 am 
FACTS @ ABN B4, TELS room

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  • In order to collect high-quality images with transmission electron microscopes, samples have to be specially prepared so that their dimensions meet the requirements of the microscope.
  • Depending on the nature of the materials to be examined, different sample preparation techniques are required and these will be introduced in this short course.
  • Users often encounter other sample problems that prevent them from obtaining images. These will be discussed in the short course as well.
  • This short course is recommended for current and potential TEM users

Crystal orientation mapping using X-rays

Level: Experienced XRD users

Instructor: Pio Buenconsejo (FACTS)

9 March 2021 1 - 3 pm

FACTS @ ABN B4, TELS room

Register now

 

Crystalline materials exhibit anisotropic properties such as resistance to deformation, large transformation strain, high electron mobility, enhanced surface catalytic activity, and huge magnetisation, along certain crystallographic directions. Correlating materials properties with crystal orientation could be a key to understanding its functional behaviour and unlocking its potential. This short course will cover the fundamentals and applications on how to use X-ray diffraction analysis as a tool to map crystal orientation in materials. Some examples will be shown such as crystal facet indexing and texture analysis of polycrystalline materials.

Chemical imaging in scanning electron microscopy

Level:  Experienced SEM users

Instructors: Jason Herrin (FACTS) & Alan Lim (FACTS)

10 March 2021, 1-3pm 
FACTS @ ABN B4, TELS room

Register now 

 
Defining the spatial relationships of different chemical components is often an important part of sample characterisation. Chemical images can be useful visual communication aids for talks and presentations, and key figures in publications. Energy-Dispersive Spectroscopy (EDS) and Wavelength-Dispersive Spectroscopy (WDS) are two related SEM-based techniques available to FACTS users, offering imaging of chemical features at a range of spatial scales from centimetres down to microns, and sometimes smaller. This short course will cover the theory behind these techniques and offer tips for success. A short demonstration using Oxford Aztec software will be included. 


TitleDate & VenueSpeaker
Introduction to Transmission Electron Microscopy (TEM)

8 October 2020 (Thursday)

10:00 – 12:00

Lecture Theatre at The Arc (LHN-LT)

Chris Boothroyd
Introduction to X-ray Diffraction and Analysis (XRD)

15 Oct 2020 (Thursday)

10:00 - 12:00

Lecture Theatre at The Arc (LHN-LT)

Samuel Morris
Introduction to Scanning Electron Microscopy (SEM)

15 October 2020 (Thursday)

13:00 - 14:30

Lecture Theatre at The Arc (LHN-LT)

Derrick Ang
SEM-based X-ray microanalysis (EDS and WDS)

21 October 2020 (Wednesday)

14:00 - 16:00

TELS studio, ABN B4

Jason Herrin
Probing at the nanoscale using Small and Wide Angle X-ray Scattering (SAXS/WAXS) technique

22 October 2020 (Thursday)

14:00 - 16:00

TELS studio, ABN B4

Pio John Buenconsejo
EBSD Advanced training

Day 1 27th Oct 10-12am ; 2-5pm; Day 2: 28th Oct 10-1230pm

TELS studio, ABN B4

Dr. Wu Jiang (Oxford Nanoinstruments Analysis)
X-Ray EDS: Data Processing With Aztec Software

29th Oct 2-5pm

Concurrent TELS Studio, ABN B4 / MS Teams Live Event

Dr. Wu Jiang (Oxford Nanoinstruments Analysis)

A series of advanced topics for Transmission Electron Microscopy (TEM)

2 Nov 2020 (Mon) - 5 Nov 2020 (Thu), 10:00 am - 12:00 pm

Lecture Theatre at The Arc (LHN-LT)

Chris Boothroyd

 

Title and other detailsCourse description

X-ray Photoelectron Spectroscopy Introductory Workshop 

Level: All users

17 - 18 May 2021, e-workshop

Register here

The X-ray Photoelectron Spectroscopy (XPS) Introductory Workshop is an e-workshop organised by the Facility for Analysis Characterisation Testing and Simulation (FACTS), Nanyang Technological University, Singapore. This 2 half-day online workshop will include talks given by experts in the field of XPS, covering an overview of this surface characterisation technique and its application in materials research. Registration is free for all. 

X-ray Fluorescence Introductory Workshop
Level:  All users or potential users

Instructors: Samuel Morris (FACTS) & Hou Ran Low (Bruker Singapore)

22 March 2021, 9:30am - 3pm

The ARC LHN-LT Level B1

Register now

This introductory workshop will cover the basic theory of how fluorescence and an XRF machine work, followed by more practical advice on sample preparation and data analysis by Dr Hou Ran, the Bruker application scientist for XRF who has been working in the field for over a decade. Throughout all the lectures and demonstrations, our aim is to give you the basic understanding to optimize XRF for your samples, know its limitations and to cut out errors that lead to inaccurate and imprecise results.

EVA/TOPAS Workshop

Level: All users

Instructor: Tom Baikie (Bruker Singapore)

17 Dec 2020 (Thursday), 10:00 - 16:00
Location: TELS studio, ABN B4

Register now

This is a workshop jointly organised by FACTS and Bruker. 
In this 1-day workshop, participants will get hands-on experience with the XRD DIFFRAC.SUITE software, TOPAS and EVA. 
As the class size will be small, they will also get sufficient chances for interaction with our XRD expert.

ASEAN ACM 2020

Level: All users

Open to all ASEAN researchers from industry and, academia and research organizations

7-11 Dec 2020, e-workshop


Emerging   capabilities   in   materials   characterisation   are   enabling   ASEAN researchers  to  build  the  technology  of  tomorrow.  In  collaboration  with  the  ASEAN Committee   on   Science,   Technology,   and   Innovation   (COSTI)   Subcommittee   for Materials  Science  &  Engineering  (SCMST),  the  Facility  for  Analysis  Characterisation Testing  and  Simulation  (FACTS)  at  Nanyang  Technological  University,  Singapore,  is pleased   to   announce   an   online   workshop   covering   the   use   of   advanced characterisation techniques in metallurgy. 
     This   week-long   series   of   half-day   sessions   will   include   webinars   and demonstrations  by  experts  and  invited  speakers  covering  theory,  techniques,  and applications  to  help  you  get  the  most  out  of  your  instruments  or  elevate  your research  to  new  levels.  This  event  is  open  to  all  ASEAN  researchers  from  industry, academia and research organisations.

 

ICMAT-2019 Symposium A
Investigation of Materials at the Nanoscale using Electrons and X-rays

Marina Bay Sands, Singapore

23-28 June 2019 

Conference website

ISPAC-2016 29th International Symposium on Polymer Analysis and Characterization
NEC, Nanyang Technological University, Singapore
12-15 June 2016
Short Course, 12 June 2016

Conference Website