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Upcoming events
FACTS short courses
(For more details please click the 'Short courses' tab below to register.)
Upcoming courses
May 2025 Transmission electron microscopy short course series
| Date / Venue | Topics |
20th May 2025 (Tuesday)
| X-ray spectroscopy in the transmission electron microscope Speaker: |
| 21st May 2025 (Wednesday) 10:00 AM - 11:30 AM FACTS@ABN (ABN-B4b-10), TELS Room | Electron energy-loss spectroscopy When electrons pass through a sample in a TEM the interactions cause energy losses which can be used both to identify the elements present and determine their chemical state. This talk will cover the methods for recording, interpreting and quantifying energy-loss spectra. It will also cover the theory behind the features present in spectra. Some understanding of the material covered in the introduction to TEM will be useful. Speaker: |
Past courses
May 2025 Transmission electron microscopy short course series
| Date / Venue | Topics |
5 May 2025 (Monday) FACTS@ABN (ABN-B4b-10), TELS Room
| FACTS Short Course: High-resolution transmission electron microscopy Our highest resolution transmission electron microscope (TEM) can resolve features with a resolution of better than 0.1nm. But the resulting images are not straightforward to interpret. This talk will cover the theory behind the scattering of electrons by materials, the formation of images in the electron microscope and simulation of images. An understanding of the material covered in the introduction to TEM will be assumed. |
6th May 2025 (Tuesday) FACTS@ABN (ABN-B4b-10), TELS Room
| FACTS Short Course: Practical Considerations of HRTEM (Theory) |
| 7th May 2025 (Wednesday) 10:00 AM - 11:30 AM FACTS@ABN (ABN-B4b-10), TELS Room | FACTS Short Course: Practical Considerations of HRTEM (Practical) Speaker: |
8th May 2025 (Thu), LHN-B1-15 (Lecture Theatre at The Arc) | FACTS Short Course: Introduction to Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM) This course offers an introduction to Focused Ion Beam-Scanning Electron Microscopy (FIB-SEM), from its historical development to cutting-edge applications. Participants will learn about different ion sources (e.g. LMIS, plasma), electron/ion-solid interactions, sputtering yield, and gas-assisted deposition/etching processes. Key applications such as TEM lamella preparation, cross-sectioning, 3D tomography, and nanopatterning will be highlighted. The course also covers advanced FIB-SEM workflows, including multimodal analysis with 3D EDS, EBSD, and ToF-SIMS tomography for comprehensive material characterization. Designed for both beginners and experienced users, the session provides valuable insights into FIB-SEM’s pivotal role in nanofabrication, materials science, and failure analysis. Speaker: |
| 13th May 2025 (Tuesday) 10:00 AM - 11:30 AM FACTS@ABN (ABN-B4b-10), TELS Room | FACTS Short Course: Scanning Transmission Electron Microscopy Scanning transmission electron microscopy (STEM) is an alternative to TEM for imaging thin samples in transmission. STEM images are usually easier to interpret than TEM images and STEM can do chemical mapping at high resolution. This talk will cover the theory behind STEM imaging and the variety of information that can be obtained from STEM. An understanding of the material covered in the introduction to TEM will be assumed. Speaker: |
| 15th May 2025 (Thursday) 10:00 AM - 11:30 AM FACTS@ABN (ABN-B4b-10), TELS Room | FACTS Short Course: Practical Considerations of STEM (Theory) |
| 16th May 2025 (Friday) 10:00 AM - 11:30 AM FACTS@ABN (ABN-B4b-10), TELS Room | FACTS Short Course: Practical Considerations of STEM (Practical) |
December 2024 Transmission electron microscopy short course series
| Date / Venue | Topics |
4 Dec 2024 (Wed), Lecture Theatre at The Arc |
FACTS Short Course: Introduction to Scanning Electron Microscopy (SEM) This short introduction course aims to introduce potential users to the basics of SEM, its capabilities, and its limitations. By developing a theoretical understanding of the technique, it is hoped that new users will learn more quickly, work more efficiently, and maximize the capabilities of these instruments to excel further in their research. Speaker: Dr Derrick Ang, NTU FACTS
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6 Dec 2024 (Fri), Lecture Theatre at The Arc (LHN-B1-15)
| FACTS Short Course: Introduction to X-ray Diffraction and Analysis This introductory course on Powder X-ray Diffraction (XRD) will cover the fundamentals of the crystalline state, the principles of X-ray interaction with crystalline materials, and practical guidance on conducting X-ray diffraction experiments. The course will also include tips and tricks for successful experimentation and introduce the basics of data analysis. Additionally, the session will discuss various applications of XRD in research. This talk will be presented by Dr. Konstantin Sakharov. He currently conducts user training on powder XRD machines at FACTS and has a research focus on three-dimensional and layered perovskite-type chalcogenides, as well as in-situ XRD measurements. Speaker: Dr Konstantin Sakharov; NTU FACTS |
6 Dec 2024 (Fri), FACTS@ABN (ABN-B4b-10) TELS Room | FACTS Short Course: Introduction to Transmission Electron Microscopy (TEM) Transmission electron microscopy can give information about the structure, chemical composition and many other parameters of a sample at resolutions down to the atomic scale. This course will provide an introduction to how TEM works and what the different TEM techniques are useful for. The basic (and some not so basic) theory of electron scattering in materials will be covered. A more advanced course will follow at a later date. Speaker: |
10 Dec 2024 (Tue), FACTS@ABN (ABN-B4b-10)
| FACTS Short Course: X-ray spectroscopy - SEM-EDS, XRF and EPMA This short course introduces the use of x-ray spectroscopy for elemental analysis, in the scanning electron microscopes, x-ray florescence and the EPMA. This include concepts on how signals are emitted, detected and processed by hardware; spectra representation and the main differences between energy dispersive and wavelength dispersive systems This provides the necessary understanding for good data collection for microanalysis and requirements needed for sample preparation. This short course is for users who have a need to conduct elemental analysis on their samples and is seeking appreciation on the means to do so appropriately. Speaker: Lim Ming Pin, Alan; NTU FACTS |
FACTS Short Course: Transmission Electron Microscopy Short Course Series
This is a series of short courses on the various aspects of using a transmission electron microscope (TEM) ranging from sample preparation to the various techniques that can be done with a TEM like high-resolution transmission electron microscopy (HRTEM), electron diffraction, two-beam imaging and scanning transmission electron microscopy (STEM).
Speakers:
Dr Tay Yee Yan, Senior Research Fellow, FACTS, NTU Singapore
Dr Richard Webster, Research Associate, UNSW Sydney
Note:
An email confirmation will be sent a week before the actual short course date to confirm whether your registration has been successful. As seats are limited for the in-person short courses, we would appreciate that you register for these courses only if you are able to attend and cancel your registration if you are subsequently unable to attend. Thank you!
| Dates | Topics |
3rd June 10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time) FACTS TELS Room | Practical Considerations of HRTEM (Theory) Field Emission TEM can easily resolve information at sub-nanometer distances giving us insight into crystallinity of materials and atomic ordering. This talk will focus on the practical aspects of aligning the microscope in order to achieve and maintain the best resolution images in the TEM and will discuss imaging conditions, sample preparation and orientation and the microscope room environment.Speaker: Richard Webster (UNSW) |
4th June
10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time)
FACTS TELS Room | Practical Considerations of HRTEM (Practical) Following on the from theory session the previous day, this practical demonstration will show the steps required to achieve and moreover, optimise HRTEM images on the JEOL F200 at UNSW. Speaker: Richard Webster (UNSW) |
6th June
10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time)
Zoom meeting | Electron Diffraction in Transmission Electron Microscope (Theory) Speaker: Tay Yee Yan (NTU) |
7th June
10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time)
Zoom meeting | Electron Diffraction in Transmission Electron Microscope (Practical) The second part of this short course is a demo session on data collection and post processing considerations for the electron data. This short course is recommended for potential and current TEM users. Speaker: Tay Yee Yan (NTU) |
27th June
10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time)
FACTS TELS Room | 2 beam imaging (Theory) Diffraction contrast is one of the key benefits of using a TEM. This allows us, among other things, to visualise the location and density of defects and dislocations in our materials. This talk will focus on the theory of diffraction contrast imaging and give examples of use cases beyond dislocations in metals. Speaker: Richard Webster (UNSW) |
28th June 10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time) FACTS TELS Room | 2 beam imaging (Practical) Following on from the previous day's talk this live practical session will demonstrate the sample tilting and imaging conditions required for imaging dislocations and precipitates in metals using diffraction contrast. Speaker: Richard Webster (UNSW) |
18th June
10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time)
Zoom meeting | Transmission Electron Microscope (TEM) Sample Preparation Part 1 In order to collect high-quality images with transmission electron microscopes, samples have to be specially prepared so that their dimensions meet the requirements of the microscope. In the first part of the short course, major TEM sample preparation techniques will be discussed. This short course is recommended for current and potential TEM users. Speaker: Tay Yee Yan (NTU) |
19th June
10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time)
Zoom meeting | Transmission Electron Microscope (TEM) Sample Preparation Part 2 In the second part of the short course, we will discuss sample problems that users often encounter that that prevent them from obtaining images successfully. Tips and tricks to improve the chance of sucessful imaging will be shared. This short course is recommended for current and potential TEM users. Speaker: Tay Yee Yan (NTU) |
1st July
10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time)
FACTS TELS Room | Practical Considerations of STEM (Theory) Modern TEMs may generally also be operated in Scanning TEM mode which can give extra insight into the crystallinity and elemental distribution in our materials. This talk will explore the theory and practical considerations required to achieve atomic resolution STEM images. Speaker: Richard Webster (UNSW) |
2nd July
10-11:30 am (Singapore Time) 12-1:30 pm (Australia Time)
FACTS TELS Room | Practical Considerations of STEM (Practical) Following on from the theory session the previous day, this practical demonstration will show the steps required to acquire HR-STEM images on the JEOL F200 at UNSW. Speaker: Richard Webster (UNSW) |
Basic Introductory Short Courses | Dates |
Introduction to X-ray Diffraction (XRD) and Analysis Samuel A. Morris (FACTS) This introductory course to X-ray Diffraction will cover the basics of the crystalline state, the theory of how X-rays interact with crystalline matter and how to run an X-ray diffraction experiment with a few tips and tricks. The talk will be split up into two 45-minute sessions, by the end of which you will be able to take your crystalline powder, obtain an X-ray diffraction pattern and understand the basics of how to analyse it.This talk will be given by Dr. Samuel A. Morris, who currently runs the single-crystal diffractometer in FACTS while researching novel applications and structures of porous materials, focusing on variable-temperature, -gaseous environments and –electric potential in-situ cells for diffraction techniques. |
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Introduction to Scanning Electron Microscopy (SEM) Derrick Ang (FACTS) This short course aims to introduce potential users to the basics of SEM, its capabilities, and its limitations. By developing a theoretical understanding of the technique, it is hoped that new users will learn more quickly, work more efficiently, and maximize the capabilities of these instruments to excel further in their research. |
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Introduction to Transmission Electron Microscopy (TEM) Chris Boothroyd (FACTS) Transmission electron microscopy can give information about the structure, chemical composition and many other parameters of a sample at resolutions down to the atomic scale. This course will provide an introduction to how TEM works and what the different TEM techniques are useful for. The basic (and some not so basic) theory of electron scattering in materials will be covered. A more advanced course will follow later in the year. |
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Introduction to X-ray Fluorescence and Analysis Samuel A. Morris (FACTS) This introductory lecture will cover the basic theory of how fluorescence and an XRF machine work, followed by more practical advice on sample preparation and data analysis. Our aim is to give you the basic understanding of how to optimize your XRF experiment, know its limitations and to cut out errors that lead to inaccurate and imprecise results.This talk will be given by Dr. Samuel A. Morris, who specializes in structural and elemental X-ray techniques at FACTS while researching novel applications and structures of porous and layered materials. |
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Topical and Advanced Short Courses | Dates |
High-resolution transmission electron microscopy Chris Boothroyd (FACTS) Our highest resolution transmission electron microscope (TEM) can resolve features with a resolution of better than 0.1nm. But the resulting images are not straightforward to interpret. This talk will cover the theory behind the scattering of electrons by materials, the formation of images in the electron microscope and simulation of images. An understanding of the material covered in the introduction to TEM will be assumed. |
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Scanning transmission electron microscopy Chris Boothroyd (FACTS) Scanning transmission electron microscopy (STEM) is an alternative to TEM for imaging thin samples in transmission. STEM images are usually easier to interpret than TEM images and STEM can do chemical mapping at high resolution. This talk will cover the theory behind STEM imaging and the variety of information that can be obtained from STEM. An understanding of the material covered in the introduction to TEM will be assumed. |
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X-ray spectroscopy in the transmission electron microscope Chris Boothroyd (FACTS) Electron irradiation in a TEM creates X-rays whose energies can be used to identify the elements present in a sample. This talk will cover the generation of X-rays, how X-rays are recorded and how to interpret the resulting spectra. This talk overlaps with some of the material covered in "SEM-based X-ray microanalysis (EDS and WDS)" but will be more focused on TEM. Some understanding of the material covered in the introduction to TEM will be useful. |
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Electron energy-loss spectroscopy Chris Boothroyd (FACTS) When electrons pass through a sample in a TEM the interactions cause energy losses which can be used both to identify the elements present and determine their chemical state. This talk will cover the methods for recording, interpreting and quantifying energy-loss spectra. It will also cover the theory behind the features present in spectra. Some understanding of the material covered in the introduction to TEM will be useful. |
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Enhancing TEM Understanding Through Live Demonstrations We are excited to offer practical demonstrations designed to enrich your understanding of key topics discussed in the TEM short courses. Dive deeper into the world of High Resolution Transmission Electron Microscopy (HRTEM), Scanning Transmission Electron Microscopy (STEM), Energy Dispersive X-ray Spectroscopy (EDX), and Electron Energy Loss Spectroscopy (EELS) through hands-on experiences that bring these concepts to life.These demonstrations will be carried out on four of our TEMs, including state-of-the-art Aberration-Corrected TEMs (ACTEMs), providing a unique opportunity to see these advanced techniques in action. Open to all interested NTU staff and students, with a special invitation extended to participants of the TEM short courses, this is a chance not to be missed for anyone looking to enhance their learning and apply theoretical knowledge in a practical setting. Join us and elevate your understanding of TEM to the next level! |
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Transmission Electron Microscope (TEM) Sample Preparation Tay Yee Yan (FACTS)
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Introduction to Crystallography Dr Stevin S. Pramana (Lecturer, Newcastle University, UK) Controlling and optimising material functionalities are the primary objective of materials engineering; however, to achieve this, investigative competence in materials characterisation and analyses, supported by fundamental understanding of crystal structure and chemistry of materials is required. In this workshop, a basic crystallography will be discussed - the concept of lattice, unit cell, symmetry operations, extracting information from international table for crystallography, plane group, space group, interaction of symmetry elements, crystal structure projection, iso-/altervalent substitution, Vegard’s law. |
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Rietveld refinement of XRD patterns using TOPAS Instructor: Sam Morris (FACTS) In this 2-day workshop, participants will get hands-on experience with the TOPAS 6 software. The class size is kept small so that participants will get adequate guidance on how to use TOPAS for various refinement and sufficient chances to interact with our XRD experts. |
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X-ray scattering and diffraction analysis of thin film materials Pio Buenconsejo (FACTS) Thin films are found in many technologically important devices as an integrated component serving various functions. They typically have a thickness in the range of 10 nm to 1000 nm, strong preferred orientation, and different levels of crystallinity. All these characteristics makes it challenging to study the structure and property of thin film by conventional XRD scan with Bragg-Brentanno geometry (BBG). For this reason, X-ray analysis of thin films require a different diffractometer set-up and data collection method. This short course will introduce some of the most widely available X-ray scattering and diffraction methods to study thin film materials, such as XRR, GIXRD, analysis of textured films, and high-resolution XRD scans. |
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Residual stress analysis of materials using X-ray diffraction Pio Buenconsejo (FACTS) X-ray diffraction (XRD) is typically used to measure lattice spacings of a crystalline material for phase identification and quantification. When the crystals are subjected to stress the lattice spacing can increase or decrease, and by measuring these changes using XRD the micro/macro stress-strain state of materials can be evaluated. XRD measurements are non-destructive and requires less rigid sample preparation step making it more suitable for various applications. In this short course the method to evaluate the stress-strain state of a material using diffraction techniques, such as sin2psi method, will be introduced along with different case scenarios and examples. |
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Probing at the nanoscale using Small and Wide Angle X-ray Scattering (SAXS/WAXS) technique Pio Buenconsejo (FACTS) Small angle X-ray scattering (SAXS) is used to study the structure of a material at length scales in the nanometer range to investigate size, shape, order, orientation and distribution. Wide angle X-ray scattering (WAXS) on the other hand captures the interatomic distances at the sub-nanometer range shedding light on the atomic ordering and/or crystallinity of the material. This course will introduce new users to the basic principles of SAXS/WAXS, transmission and grazing incident experiments, data analysis and some examples related to materials science research. |
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Crystal orientation mapping using X-rays Pio Buenconsejo (FACTS) Crystalline materials exhibit anisotropic properties such as resistance to deformation, large transformation strain, high electron mobility, enhanced surface catalytic activity, and huge magnetisation, along certain crystallographic directions. Correlating materials properties with crystal orientation could be a key to understanding its functional behaviour and unlocking its potential. This short course will cover the fundamentals and applications on how to use X-ray diffraction analysis as a tool to map crystal orientation in materials. Some examples will be shown such as crystal facet indexing and texture analysis of polycrystalline materials. |
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Advanced EBSD data processing based on AZtecCrystal / AztecHKL Dr Wu Jiang (Oxford Nanoinstruments Analysis) This 1.5 day short course is for existing EBSD users and it is expected that users after this short course will understand the Aztec software processing platform better and move to the next level of application use after training. We also invite EBSD users who have application questions on EBSD usage join us on-site for a discussion on their work in EBSD.The short course is co-organised by FACTS and Oxford Nanoinstruments (OINA). |
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Past Workshops
| 3-day X-ray Workshop Series, jointly organized with Facility for Analysis, Characterisation, Testing and Simulation (FACTS) |
Venue
Presenters:
| Workshop contents: Day 1: 28 Nov (Tues), 10:00 AM - 4:30 PM Morning (Hybrid Mode - Online on Zoom or In-person), 10:00 AM - 12:00 PM Introduction to & Applications of XRF Afternoon (In-person, limited slots available) Hands-on session: Applications of XRF with user samples / data Day 2: 29 Nov (Wed), 09:30 AM - 04:30 PM Morning (In person) X-ray Diffraction - Sample Preparation; Sample / Machine effects Introduction to DIFFRAC.TOPAS Afternoon (In-person, limited slots available) Hands-on session: Rietveld refinement, Quantitative phase analysis (QPA) Day 3: 30 Nov (Thurs), 09:30 AM - 04:30 PM Morning (Hybrid Mode - Online on Zoom or In-person) Best practices for QPA & Hands-on examples Internal / external standards Afternoon (In-person, limited slots available) Hands-on session : Merge XRF & XRD data using DIFFRAC.EVA |
MSE – FACTS Joint Seminar:
Wednesday, 15 November 2023 ǁ Time: 2:00 PM – 3:00 PM ǁ
| Abstract In recent years the advent of fast and sensitive direct electron detectors, coupled with a huge increase in computing power, has enabled the nanoscale study of ‘soft’ materials that had previously been considered too beam-sensitive to investigate with the electron microscope. In addition, new 4D-STEM methods have evolved that allow a wealth of crystallographically-rich information to be acquired. Here we use a variant of 4D-STEM called scanning electron diffraction (SED) to investigate the local crystallography and, in particular, the nature of the disorder seen in certain polymers, molecular solids and hybrid organic-inorganic materials. SED uses a focussed but weakly-convergent beam such that when the beam is rastered across a 2D region of interest a 4D data set is acquired consisting of many thousands of ‘spot’ diffraction patterns. Such patterns can be analysed to provide information, for example, about changes in local orientation, determined through changes in the geometry of the pattern, and the distribution of microstructural defects through changes in the intensity of particular diffracted beams and the subsequent formation of ‘virtual’ dark field images. This presentation will focus on the development of the SED technique and what new structural information can be obtained from conformationally-disordered polymers, liquid crystalline polymers, twisted organic nanostructures and heterogeneous metal-organic frameworks.
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| Title and other details | Course description |
FACTS Seminar: Rigaku Advances in Electron Crystallography Speaker: Dr. Mark Benson (Rigaku)Event Date: 28 Aug 2023 (Mon), 02:15 PM - 03:15 PM Venue: FACTS@ABN (ABN-B4b-10), TELS Room | The Rigaku XtaLAB Synergy-ED is a fully integrated electron diffractometer with a seamless workflow from data collection to 3D structure determination. The XtaLAB Synergy-ED is the result of Rigaku’s collaboration with JEOL, synergistically combining each partner’s core technologies: Rigaku’s hybrid-pixel electron detector (HyPix-ED) and CrysAlisPro software, and JEOL’s long-standing excellence in electron beam generation and control. Using 3D electron diffraction (3DED), a.k.a. microED, single crystals of all classes below one-micron in size can be studied. The XtaLAB Synergy-ED offers a wide range of experiments, including low temperature, which confers benefits such as: reduced beam damage; improved resolution; reduced disorder; and in the case of electron diffraction, stabilization of samples in vacuo. As electron diffraction requires samples to be studied under high vacuum, cryo-transfer - freezing of samples prior to introduction to vacuum - is essential for sensitive compounds, e.g. proteins or MOFs. Combining cryo-transfer with variable detector distance further allows the study of solvated crystals, including proteins, in the XtaLAB Synergy-ED. |
X-Ray Diffraction Workshop 2023: Making the most of your in-situ XRD investigations Level: Anyone interested in in-situ XRD investigations Presenters: Event Date: 23 Jun 2023 (Fri), 10:00 AM - 3:00 PM Venue: The Arc – Learning Hub North (LHN), LHN-TR+36 (Level 2) | Abstract: This is an one day workshop jointly organised by FACTS, NTU and Anton Paar. |
| Title and other details | Course description |
 | Abstract: Materials can be patterned to change the way in which they interact with light. They can be made to absorb in specific wavelength bands, have polarization-dependent colour, or light can even be trapped on a surface. These properties can be engineered by controlling one or more resonant modes, such as Mie resonances, surface plasmon resonances and bound states in-the-continuum. In this presentation, it will be shown that the scanning TEM (STEM) can be a unique and useful tool to measure optical properties at the nanometer length scale. For example, it will be demonstrated how monochromated electron energy loss-spectroscopy (EELS) can be used to measure femtosecond electron dynamics in plasmons with nanometer spatial precision. By combining this technique with STEM-cathodoluminescence, it is also possible to visualize light that is trapped on surfaces in so-called bound-states-in-the-continuum. Quantitative, nanoscale measurements even allow us to directly measure the coherent interaction length of these optical modes. About the speaker: Dr Bosman is an Associate Professor at the National University of Singapore and a Scientist at the A*STAR Institute of Materials Research and Engineering in Singapore, specializing in Scanning Transmission Electron Microscopy (STEM). He is trained at Delft University of Technology (the Netherlands) and at the University of Sydney, with postdoctoral experience in Australia, the UK, and Singapore. His research focuses on nanoscale sample characterization using electron spectroscopy and on the development of experimental nano-optical techniques in the STEM, such as monochromated electron energy-loss spectroscopy (EELS). |
X-ray Photoelectron Spectroscopy Introductory Workshop Level: All users 17 - 18 May 2021, e-workshop
| The X-ray Photoelectron Spectroscopy (XPS) Introductory Workshop is an e-workshop organised by the Facility for Analysis Characterisation Testing and Simulation (FACTS), Nanyang Technological University, Singapore. This 2 half-day online workshop will include talks given by experts in the field of XPS, covering an overview of this surface characterisation technique and its application in materials research. Registration is free for all. |
X-ray Fluorescence Introductory Workshop Instructors: Samuel Morris (FACTS) & Hou Ran Low (Bruker Singapore) 22 March 2021, 9:30am - 3pm The ARC LHN-LT Level B1 | This introductory workshop will cover the basic theory of how fluorescence and an XRF machine work, followed by more practical advice on sample preparation and data analysis by Dr Hou Ran, the Bruker application scientist for XRF who has been working in the field for over a decade. Throughout all the lectures and demonstrations, our aim is to give you the basic understanding to optimize XRF for your samples, know its limitations and to cut out errors that lead to inaccurate and imprecise results. |
EVA/TOPAS Workshop Level: All users Instructor: Tom Baikie (Bruker Singapore) 17 Dec 2020 (Thursday), 10:00 - 16:00Location: TELS studio, ABN B4 | This is a workshop jointly organised by FACTS and Bruker. In this 1-day workshop, participants will get hands-on experience with the XRD DIFFRAC.SUITE software, TOPAS and EVA. As the class size will be small, they will also get sufficient chances for interaction with our XRD expert. |
ASEAN ACM 2020 Level: All users Open to all ASEAN researchers from industry and, academia and research organizations 7-11 Dec 2020, e-workshop | Emerging capabilities in materials characterisation are enabling ASEAN researchers to build the technology of tomorrow. In collaboration with the ASEAN Committee on Science, Technology, and Innovation (COSTI) Subcommittee for Materials Science & Engineering (SCMST), the Facility for Analysis Characterisation Testing and Simulation (FACTS) at Nanyang Technological University, Singapore, is pleased to announce an online workshop covering the use of advanced characterisation techniques in metallurgy. This week-long series of half-day sessions will include webinars and demonstrations by experts and invited speakers covering theory, techniques, and applications to help you get the most out of your instruments or elevate your research to new levels. This event is open to all ASEAN researchers from industry, academia and research organisations. |
Events
Come down to have a look at our Electron Microscopy, X-ray Diffraction and Surface Analysis instruments and chat with our scientists about how our equipment can help your experiments and work.
We have a variety of capabilities across a broad range of high-end instruments.
From SEMs, through to environmental FESEM, aberration-corrected TEM, cryo TEM, Auger spectroscopy, EPMA, EBSD and FIB.
For our X-ray Scattering section we house powder, thin-film, XRR, XRF, single-crystal, SAXS/WAXS and XPS.
Our most common in-situ capabilities are variable temperature, electrochemical cycling, lithography, etching and electrical biasing.
If you want to discuss more or possible collaboration, please come by and have a chat with our staff scientists.
Please Register now
We look forward to welcoming you to FACTS!
Past Events
FACTS - Art of Science Competition 2023
FACTS is hosting another Art of Science competition to let you, our users, show off your science and artistic skills. This year’s competition encompasses both electron microscopy and X-ray diffraction with two prize pools for the categories of Scientific and Artistic images. This competition allows our researchers and students an avenue to share their research through visual means. Captivating images will be displayed in the FACTS laboratory. They will serve an important role to showcase the research & technical expertise of our university.
Electron microscopy (SEM, TEM) is an important visualization tool in materials science and engineering. It enables us to study materials at the nanoscale level and its images can provide information that help in the understanding of materials and their properties.
X-ray Diffraction (XRD) is an essential structural characterisation tool. The competition is open to all types of X-ray analysis from raw data through to refinements and model structures. Examples might include 2D small angle raw data files that show almost cloudlike scattering intensity, to the precession images of single-crystal XRD, to variable temperature PXRD patterns that show the movement of peaks.
Prizes for each category (scientific and artistic)
| 1st prize | S$500 |
| 2nd prize | S$300 |
| 3rd prize | S$200 |
| 10 Consolation prizes | S$20 Starbucks voucher |
Rules and guidelines
- This image competition is open to NTU staff and students who are FACTS users only.
- Electron micrographs must be taken using the equipment in FACTS.
- XRD measurements must be taken with FACTS machines (from any XRD cluster), while refinements must be completed using data obtained
on one of the FACTS XRD machines.
- There is a limit of 3 electron micrographs or XRD entries per person per category. The micrographs should not be repeated across categories.
- Images must be of publishable standard.
- For the Scientific category, image must be original and no further editing using software such as Photoshop is allowed.
- For the Artistic category, colouring is allowed to create a better visual effect, so long as the image is original. The original image will also
have to be submitted.
- All images are to be submitted to https://forms.office.com/r/3ksS1bpLeK as a high resolution jpeg file.
- All submitted images must include a figure caption. In addition there should be a short paragraph (up to 50 words) describing the technique
used (SEI, BEI, TEM, XRD), the object that was imaged, synthesis, material properties and applications. Do also tell us what the image
resembles if applicable (e.g. self-assembled polymer resembling a rose). Include a credit to the sample owner if appropriate.
- Include the name of your supervisor and co-supervisor during your submission.
- If the sample belongs to others, permission and approval must be obtained from the sample owner before submission.
Judging criteria
Entries will be judged on the following criteria:
- Scientific category
- Scientifically Captivating - The judging panel will rate the entries according to how captivating and meaningful they are from a scientific viewpoint, as well as from the entrants’ description.
- Artistic category
- Visually Stunning - Perspective, aesthetic attractiveness and uniqueness.
Submission deadline
31 March 2023
Submit here: https://forms.office.com/r/3ksS1bpLeK
Past Conferences
ICMAT-2023 Symposium A Investigation of Materials at the Nanoscale using Electrons and X-rays SUNTEC Singapore 26-30 June 2023 |
ICMAT-2019 Symposium A Marina Bay Sands, Singapore 23-28 June 2019 |
ISPAC-2016 29th International Symposium on Polymer Analysis and Characterization |