Course detailsCourse description

Introduction to Scanning Electron Microscopy (SEM)

Date/Time: Wednesday 28 September 2022, 14:30 - 16:00
Location: Lecture Theatre at The Arc (LHN-LT)
Speaker: Dr. Derrick Ang

Register now

 

This short introduction course aims to introduce potential users to the basics of SEM, its capabilities, and its limitations. 
By developing a theoretical understanding of the technique, it is hoped that new users will learn more quickly, work more efficiently, and maximize the capabilities of these instruments to excel further in their research. 

Introduction to Transmission Electron Microscopy (TEM)

Date/Time: Thursday 29 September 2022, 10:00 – 11:30
Location: Lecture Theatre at The Arc (LHN-LT)
Speaker: Dr. Chris Boothroyd

Register now

Transmission electron microscopy can give information about the structure, chemical composition and many other parameters of a sample at resolutions down to the atomic scale. This course will provide an introduction to how TEM works and what the different TEM techniques are useful for. The basic (and some not so basic) theory of electron scattering in materials will be covered. A more advanced course will follow at a later date.

Introduction to X-ray Diffraction and Analysis

Date/Time: Wednesday 12 October 2022, 14:00 - 16:00
Location: Lecture Theatre 10
Speaker: Dr. Samuel A. Morris

Register now

 

 

This introductory course to X-ray Diffraction will cover the basics of the crystalline state, the theory of how X-rays interact with crystalline matter and how to run an X-ray diffraction experiment with a few tips and tricks. The talk will be split up into two 45-minute sessions, by the end of which you will be able to take your crystalline powder, obtain an X-ray diffraction pattern and understand the basics of how to analyse it.

This talk will be given by Dr. Samuel A. Morris, who currently runs the single-crystal diffractometer in FACTS while researching novel applications and structures of porous materials, focusing on variable-temperature, -gaseous environments and –electric potential in-situ cells for diffraction techniques.
Course detailsCourse description

Introduction to Crystallography
Level: Anyone interested in crystallography
Instructor: Dr Stevin S. Pramana (Lecturer, Newcastle University, UK)
21 Jul 2022 (Thurs) 3 - 5 pm
FACTS @ ABN B4, TELS room or Zoom

 

Register now

Controlling and optimising material functionalities are the primary objective of materials engineering; however, to achieve this, investigative competence in materials characterisation and analyses, supported by fundamental understanding of crystal structure and chemistry of materials is required. In this workshop, a basic crystallography will be discussed - the concept of lattice, unit cell, symmetry operations, extracting information from international table for crystallography, plane group, space group, interaction of symmetry elements, crystal structure projection, iso-/altervalent substitution, Vegard’s law.
Rietveld refinement of XRD patterns using TOPAS
Level: Basic XRD users
Instructor: Sam Morris (FACTS)
Assistant Instructors: Pio Buenconsejo (FACTS) and Liu Weiling (FACTS)
25 & 26 Apr 2022 (Mon & Tue) 10am - 4 pm
FACTS @ ABN B4, TELS room

Register now

In this 2-day workshop, participants will get hands-on experience with the TOPAS 6 software. The class size is kept small so that participants will get adequate guidance on how to use TOPAS for various refinement and sufficient chances to interact with our XRD experts.

Crystal orientation mapping using X-rays
Level: Experienced XRD users
Instructor: Pio Buenconsejo (FACTS)
27 Apr 2022 (Wed) 2 - 4 pm
FACTS @ ABN B4, TELS room

Register now

 

Crystalline materials exhibit anisotropic properties such as resistance to deformation, large transformation strain, high electron mobility, enhanced surface catalytic activity, and huge magnetisation, along certain crystallographic directions. Correlating materials properties with crystal orientation could be a key to understanding its functional behaviour and unlocking its potential. This short course will cover the fundamentals and applications on how to use X-ray diffraction analysis as a tool to map crystal orientation in materials. Some examples will be shown such as crystal facet indexing and texture analysis of polycrystalline materials.
Advanced EBSD data processing based on AZtecCrystal / AztecHKL


Level: Experienced EBSD users
Instructor: Dr Wu Jiang (Oxford Nanoinstruments Analysis)
Day 1 11th May 10-12am ; 2-5pm
Day 2: 12th May 10-2amFACTS @ ABN B4, TELS room

Register now

This 1.5 day short course is for existing EBSD users and it is expected that users after this short course will understand the Aztec software processing platform better and move to the next level of application use after training. We also invite EBSD users who have application questions on EBSD usage join us on-site for a discussion on their work in EBSD.

The short course is co-organised by FACTS and Oxford Nanoinstruments (OINA).

High-resolution transmission electron microscopy

Instructor: Chris Boothroyd (FACTS)
17 May 2022 (Tue) 9.30 - 11 am
LT at The ARC (map)
Register now

Our highest resolution transmission electron microscope (TEM) can resolve features with a resolution of better than 0.1nm. But the resulting images are not straightforward to interpret. This talk will cover the theory behind the scattering of electrons by materials, the formation of images in the electron microscope and simulation of images. An understanding of the material covered in the introduction to TEM will be assumed.
Scanning transmission electron microscopy
Instructor: Chris Boothroyd (FACTS)
18 May 2022 (Wed) 9.30 - 11 am
LT at The ARC (map)
Register now
Scanning transmission electron microscopy (STEM) is an alternative to TEM for imaging thin samples in transmission. STEM images are usually easier to interpret than TEM images and STEM can do chemical mapping at high resolution. This talk will cover the theory behind STEM imaging and the variety of information that can be obtained from STEM. An understanding of the material covered in the introduction to TEM will be assumed.
X-ray spectroscopy in the transmission electron microscope
Instructor: Chris Boothroyd (FACTS)
19 May 2022 (Thur) 9.30 - 11 am
LT at The ARC (map)
Register now
Electron irradiation in a TEM creates X-rays whose energies can be used to identify the elements present in a sample. This talk will cover the generation of X-rays, how X-rays are recorded and how to interpret the resulting spectra. This talk overlaps with some of the material covered in "SEM-based X-ray microanalysis (EDS and WDS)" but will be more focused on TEM. Some understanding of the material covered in the introduction to TEM will be useful.
Electron energy-loss spectroscopy
Instructor: Chris Boothroyd (FACTS)
20 May 2022 (Fri) 9.30 - 11 am
LT at The ARC (map)
Register now
When electrons pass through a sample in a TEM the interactions cause energy losses which can be used both to identify the elements present and determine their chemical state. This talk will cover the methods for recording, interpreting and quantifying energy-loss spectra. It will also cover the theory behind the features present in spectra. Some understanding of the material covered in the introduction to TEM will be useful.
Transmission Electron Microscope (TEM) Sample Preparation
Level: Current and potential TEM users
Instructor: Tay Yee Yan (FACTS)
24 May 2022 (Tue) 9.30 – 11.30 am
FACTS @ ABN B4, TELS room
Register now
• In order to collect high-quality images with transmission electron microscopes, samples have to be specially prepared so that their dimensions meet the requirements of the microscope.
• Depending on the nature of the materials to be examined, different sample preparation techniques are required and these will be introduced in this short course.
• Users often encounter other sample problems that prevent them from obtaining images. These will be discussed in the short course as well.
• This short course is recommended for current and potential TEM users

 

Course detailsCourse description

Introduction to X-ray Diffraction (XRD) and Analysis

Instructor: Samuel Morris

06 Oct 2021 (Wed), 10:00 AM - 12:00 PM

Zoom (link to be provided later)

Register now

This introductory course to X-ray Diffraction will cover the basics of the crystalline state, the theory of how X-rays interact with crystalline matter and how to run an X-ray diffraction experiment with a few tips and tricks. The talk will be split up into two 45-minute sessions, by the end of which you will be able to take your crystalline powder, obtain an X-ray diffraction pattern and understand the basics of how to analyse it.

This talk will be given by Dr. Samuel A. Morris, who currently runs the single-crystal diffractometer in FACTS while researching novel applications and structures of porous materials, focusing on variable-temperature, -gaseous environments and –electric potential in-situ cells for diffraction techniques.

Introduction to Scanning Electron Microscopy (SEM)

Instructor: Derrick Ang

06 Oct 2021 (Wed), 01:00 PM - 02:30 PM

Lecture Theatre at The Arc (LHN-LT)

Register now

This short course aims to introduce potential users to the basics of SEM, its capabilities, and its limitations. By developing a theoretical understanding of the technique, it is hoped that new users will learn more quickly, work more efficiently, and maximize the capabilities of these instruments to excel further in their research.

Introduction to Transmission Electron Microscopy (TEM)

Instructor: Chris Boothroyd

13 Oct 2021 (Wed), 10:00 AM - 11:30 AM

Lecture Theatre at The Arc (LHN-LT)

Register now

Transmission electron microscopy can give information about the structure, chemical composition and many other parameters of a sample at resolutions down to the atomic scale. This course will provide an introduction to how TEM works and what the different TEM techniques are useful for. The basic (and some not so basic) theory of electron scattering in materials will be covered. A more advanced course will follow later in the year.

Probing at the nanoscale using Small and Wide Angle X-ray Scattering (SAXS/WAXS) technique

Instructor: Pio Buenconsejo

28 Oct 2021 (Thu), 02:00 PM - 04:00 PM

TELS room at AToM@FACTS ABN

Register now

 

Small angle X-ray scattering (SAXS) is used to study the structure of a material at length scales in the nanometer range to investigate size, shape, order, orientation and distribution. Wide angle X-ray scattering (WAXS) on the other hand captures the interatomic distances at the sub-nanometer range shedding light on the atomic ordering and/or crystallinity of the material. This course will introduce new users to the basic principles of SAXS/WAXS, transmission and grazing incident experiments, data analysis and some examples related to materials science research.

 

Transmission Electron Microscope (TEM) Sample Preparation

Level:  Current and potential TEM users

Instructor: Tay Yee Yan (FACTS)

19 May 2021, 9:30 - 11:30 am 
FACTS @ ABN B4, TELS room

Register now 

 
  • In order to collect high-quality images with transmission electron microscopes, samples have to be specially prepared so that their dimensions meet the requirements of the microscope.
  • Depending on the nature of the materials to be examined, different sample preparation techniques are required and these will be introduced in this short course.
  • Users often encounter other sample problems that prevent them from obtaining images. These will be discussed in the short course as well.
  • This short course is recommended for current and potential TEM users

Crystal orientation mapping using X-rays

Level: Experienced XRD users

Instructor: Pio Buenconsejo (FACTS)

9 March 2021 1 - 3 pm

FACTS @ ABN B4, TELS room

Register now

 

Crystalline materials exhibit anisotropic properties such as resistance to deformation, large transformation strain, high electron mobility, enhanced surface catalytic activity, and huge magnetisation, along certain crystallographic directions. Correlating materials properties with crystal orientation could be a key to understanding its functional behaviour and unlocking its potential. This short course will cover the fundamentals and applications on how to use X-ray diffraction analysis as a tool to map crystal orientation in materials. Some examples will be shown such as crystal facet indexing and texture analysis of polycrystalline materials.

 

 

Title and other detailsCourse description
FACTS Webinar series 2021-11-09Abstract:

Materials can be patterned to change the way in which they interact with light. They can be made to absorb in specific wavelength bands, have polarization-dependent colour, or light can even be trapped on a surface. These properties can be engineered by controlling one or more resonant modes, such as Mie resonances, surface plasmon resonances and bound states in-the-continuum. In this presentation, it will be shown that the scanning TEM (STEM) can be a unique and useful tool to measure optical properties at the nanometer length scale. For example, it will be demonstrated how monochromated electron energy loss-spectroscopy (EELS) can be used to measure femtosecond electron dynamics in plasmons with nanometer spatial precision. By combining this technique with STEM-cathodoluminescence, it is also possible to visualize light that is trapped on surfaces in so-called bound-states-in-the-continuum. Quantitative, nanoscale measurements even allow us to directly measure the coherent interaction length of these optical modes.

About the speaker:
Dr Bosman is an Associate Professor at the National University of Singapore and a Scientist at the A*STAR Institute of Materials Research and Engineering in Singapore, specializing in Scanning Transmission Electron Microscopy (STEM). He is trained at Delft University of Technology (the Netherlands) and at the University of Sydney, with postdoctoral experience in Australia, the UK, and Singapore. His research focuses on nanoscale sample characterization using electron spectroscopy and on the development of experimental nano-optical techniques in the STEM, such as monochromated electron energy-loss spectroscopy (EELS).

X-ray Photoelectron Spectroscopy Introductory Workshop 

Level: All users

17 - 18 May 2021, e-workshop

 

Register here

The X-ray Photoelectron Spectroscopy (XPS) Introductory Workshop is an e-workshop organised by the Facility for Analysis Characterisation Testing and Simulation (FACTS), Nanyang Technological University, Singapore. This 2 half-day online workshop will include talks given by experts in the field of XPS, covering an overview of this surface characterisation technique and its application in materials research. Registration is free for all. 

X-ray Fluorescence Introductory Workshop
Level:  All users or potential users

Instructors: Samuel Morris (FACTS) & Hou Ran Low (Bruker Singapore)

22 March 2021, 9:30am - 3pm

The ARC LHN-LT Level B1

Register now

This introductory workshop will cover the basic theory of how fluorescence and an XRF machine work, followed by more practical advice on sample preparation and data analysis by Dr Hou Ran, the Bruker application scientist for XRF who has been working in the field for over a decade. Throughout all the lectures and demonstrations, our aim is to give you the basic understanding to optimize XRF for your samples, know its limitations and to cut out errors that lead to inaccurate and imprecise results.

EVA/TOPAS Workshop

Level: All users

Instructor: Tom Baikie (Bruker Singapore)

17 Dec 2020 (Thursday), 10:00 - 16:00
Location: TELS studio, ABN B4

Register now

This is a workshop jointly organised by FACTS and Bruker. 
In this 1-day workshop, participants will get hands-on experience with the XRD DIFFRAC.SUITE software, TOPAS and EVA. 
As the class size will be small, they will also get sufficient chances for interaction with our XRD expert.

ASEAN ACM 2020

Level: All users

Open to all ASEAN researchers from industry and, academia and research organizations

7-11 Dec 2020, e-workshop


Emerging   capabilities   in   materials   characterisation   are   enabling   ASEAN researchers  to  build  the  technology  of  tomorrow.  In  collaboration  with  the  ASEAN Committee   on   Science,   Technology,   and   Innovation   (COSTI)   Subcommittee   for Materials  Science  &  Engineering  (SCMST),  the  Facility  for  Analysis  Characterisation Testing  and  Simulation  (FACTS)  at  Nanyang  Technological  University,  Singapore,  is pleased   to   announce   an   online   workshop   covering   the   use   of   advanced characterisation techniques in metallurgy. 
     This   week-long   series   of   half-day   sessions   will   include   webinars   and demonstrations  by  experts  and  invited  speakers  covering  theory,  techniques,  and applications  to  help  you  get  the  most  out  of  your  instruments  or  elevate  your research  to  new  levels.  This  event  is  open  to  all  ASEAN  researchers  from  industry, academia and research organisations.

 

ICMAT-2019 Symposium A
Investigation of Materials at the Nanoscale using Electrons and X-rays

Marina Bay Sands, Singapore

23-28 June 2019 

Conference website

ISPAC-2016 29th International Symposium on Polymer Analysis and Characterization
NEC, Nanyang Technological University, Singapore
12-15 June 2016
Short Course, 12 June 2016

Conference Website