The details of the seminar are as follows:
Date: 15 July 2022 (Friday)
Time: 10:00 AM - 11:00 AM
Venue: Executive Seminar Room (S2.2-B2-53)
Co-organized by IEEE Circuits and Systems Singapore Chapter, IEEE Signal Processing Singapore Chapter, together with CISS, Centre for Information Sciences and Systems, School of Electrical and Electronic Engineering, NTU
Abstract is:
Face photo-sketch recognition plays an important role in law enforcement, particularly in narrowing down the search for potential suspects based on limited sketch information. In this work, we present a novel feature descriptor network for automated face photo-sketch recognition that is suitable for modality discrepancy and small dataset learning. By stacking an omnidirectional image difference operation over a pooling projection in a multilayer fashion, our network forms an interpretable learning system that does not show obvious overfitting on limited training data. Extensive evaluation using three public face photo-sketch databases shows competing rank-1 recognition accuracy of the proposed method comparing with state-of-the-art methods.
Speaker's Biography:
Kar-Ann Toh is a Professor in the School of Electrical and Electronic Engineering at Yonsei University, South Korea. He received the PhD degree from Nanyang Technological University (NTU), Singapore in 1999. He worked for two years in the aerospace industry prior to his post-doctoral appointments at research centers in NTU from 1998 to 2002. He was affiliated with the Institute for Infocomm Research in Singapore from 2002 to 2005 prior to his current appointment in Korea. He was a Visiting Professor at National University of Singapore in the year 2020 during his sabbatical leave. His research interests include biometrics, pattern classification, and machine learning. He has served/is serving as an Associate Editor of several international journals including IEEE Transactions on Biometrics, Behavior and Identity Science, IEEE Transactions on Information Forensics and Security, Journal of Franklin Institute, Pattern Recognition Letters, and IET Biometrics.
Hosted by A/P Lin Zhiping, School of EEE, NTU.
(Photography and/or recording may be taken during the event for news and publicity purposes.)
/enri-thumbnails/careeropportunities1f0caf1c-a12d-479c-be7c-3c04e085c617.tmb-mega-menu.jpg?Culture=en&sfvrsn=d7261e3b_1)
/cradle-thumbnails/research-capabilities1516d0ba63aa44f0b4ee77a8c05263b2.tmb-mega-menu.jpg?Culture=en&sfvrsn=1bc94f8_1)
7e6fdc03-9018-4d08-9a98-8a21acbc37ba.tmb-mega-menu.jpg?Culture=en&sfvrsn=7deaf618_1)
