Aquilos

Aquilos Cryo-FIB - Cryo-DualBeam System

A cryo focused ion beam (dual beam) scanning EM capable to prepare up to 8-10 compression-free ultrathin lamella in a day and identify biological samples using a light microscope, which subsequent used for electron microscopic analysis.

If you are interested in using the equipment or require assistance and training, please kindly contact Dr. Tran Bich Ngoc (Ann).

The FEI Aquilos Cryo-Focused Ion Beam (Cryo-FIB) is capable to gain control over the sample thickness and prepare in situ cryo-lamellas from cellular specimens grown on the EM specimen supports. The Gallium ions beam milling enables the creation of compression-free cryo lamella samples for TEM tomography imaging and avoids artifacts, such as mechanical compression inevitable for mechanical cryo-sectioning, using a cryo-ultramicrotome.

Aquilos cryo-FIB

  • High-stability Schottky FEG
  • Integrated autoloader TEM
  • Fully rotatable cryo-stage
  • A retractable sputter coater
  • Everhart-Thornley detector 
  • Sample bake-out box