TEM JEOL F200

FACTS ABN B4

Transmission electron microscope with EDX, EELS and holography

The JEOL JEM-F200 is a versatile, high-performance transmission electron microscope that serves as FACTS’ primary workhorse TEM for routine high-resolution imaging and analytical characterisation. Combining modern electron optics, advanced automation, and an intuitive user interface, it provides a reliable and efficient platform for day-to-day research while supporting a broad range of materials science applications.

The JEOL F200 features the following:

1. A new fast 4K CMOS Gatan camera for TEM in-situ measurement
2. Dual EDX (100 mm² windowless) detector with AZtec software 
3. Segmented STEM detector for Differential Phase Contrast (DPC) and Optimum Bright Field STEM (OBF ) 
4. STEM Lorentz mode
5. Tomography
6. MicroED

The F200 is equipped with a high-resolution pole piece, is compatible with cryo holders, and can be operated at 80 kV and 200 kV. 

  • High-resolution and atomic-scale imaging of materials.
  • Rapid, high-sensitivity elemental analysis using EDS with reduced beam damage.
  • Electric and magnetic field mapping using Differential Phase Contrast (DPC).
  • Low-dose imaging of light-element materials using Optimum Bright Field (OBF).
  • Characterisation of magnetic materials using STEM Lorentz mode.
  • Micro Electron Diffraction (MicroED) for crystallographic and structural analysis.
  • Routine materials characterisation in nanotechnology, semiconductors, batteries, catalysts, functional materials, and advanced materials research.