TEM JEOL JEM 2200FS

FACTS @ ABN B4

A TEM that can be operated at 200kV and 120kV, and equipped with a Schottky field emission gun

The JEOL JEM-2200FS is a field-emission transmission electron microscope equipped with an in-column Omega energy filter for enhanced imaging and diffraction applications. As the primary TEM training instrument at FACTS, it offers a reliable platform for routine materials characterisation and user training.

High resolution TEM
Tomography
Energy filtered TEM