TEM JEOL 2100F

The JEOL JEM-2100F series has been a cornerstone of the FACTS electron microscopy facility, providing researchers with reliable high-resolution imaging and analytical capabilities for many years. We have two JEOL JEM-2100 field-emission transmission electron microscopes (TEMs) with similar core capabilities. Both instruments support conventional TEM and STEM imaging, as well as energy-dispersive X-ray spectroscopy (EDX) for elemental composition analysis. One of the microscopes is additionally equipped with a Gatan Imaging Filter (GIF), enabling electron energy-loss spectroscopy (EELS) for advanced chemical and compositional analysis.

contact: Andrew Wong (Dr) at andrewwong@ntu.edu.sg