ACTEM JEOL JEM-ARM300F Grand ARM

FACTS ABN B4

Aberration corrected transmission electron microscope with EDX, EELS and holography

The JEOL JEM-ARM300F (Grand ARM) is a double aberration-corrected transmission electron microscope designed for atomic-resolution imaging and advanced analytical electron microscopy. Operating at accelerating voltages up to 300 kV, it combines sub-ångström imaging with a comprehensive suite of imaging, diffraction, spectroscopy, and magnetic characterisation techniques. The instrument provides exceptional spatial resolution and analytical versatility, making it a powerful platform for investigating the structure, chemistry, and functional properties of materials at the atomic scale.

  • Atomic-resolution TEM and STEM imaging.
  • High-resolution elemental mapping and composition analysis using EDX.
  • Chemical bonding and electronic structure analysis using EELS.
  • Energy-filtered TEM (EFTEM).
  • Electron holography.
  • Electron tomography.
  • Precession electron diffraction.
  • 4D STEM, including:
    • Ptychography
    • Strain mapping
    • Phase mapping
    • Micro Electron Diffraction (MicroED)
  • Magnetic materials characterisation using Lorentz microscopy, electron holography, and Differential Phase Contrast (DPC) imaging.
  • Advanced characterisation of semiconductors, quantum materials, catalysts, functional materials, energy materials, and nanostructures.