ACTEM JEOL JEM-ARM200F

FACTS ABN B4

Aberration corrected transmission electron microscope with EDX

The JEOL JEM-ARM200F is a 200 kV cold field-emission, probe-corrected transmission electron microscope that provides atomic-resolution imaging and advanced analytical capabilities within a single platform. Equipped with modern imaging, elemental analysis, and electron spectroscopy systems, it enables comprehensive characterisation of the structure, composition, and electronic properties of materials at the nanoscale and atomic scale.

  • Atomic-resolution STEM imaging.
  • Atomic-resolution TEM imaging.
  • High-resolution HAADF, ABF and BF STEM.
  • Atomic-resolution elemental mapping.
  • Quantitative EDX elemental analysis.
  • Electron Energy Loss Spectroscopy (EELS).
  • Energy-filtered TEM (EFTEM).
  • Energy-filtered 4D STEM.
  • Beam-sensitive materials imaging at 80 kV.
  • High-resolution materials characterisation at 200 kV.