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XRD Panalytical Xpert Pro
FACTS XRD room at N4.1 B4-10
X-ray diffractometer for polycrystalline samples in powder, thin film and bulk form.
Configured in Bragg-Brentano geometry suitable for polycrystalline XRD analysis.
- Cu-Kα radiation operated at 40kV and 30mA
- Vertical high precision goniometer
- 1D type detector: X'Celerator detector based on real time multiple strip X-ray detection for ultrafast data collection
- Batch sample automatic loader
- Beam knife attachment for data collection with low background at low 2Theta angle
- Parallel plater collimator optics for GIXRD is available
- X-ray diffraction analysis of crystalline materials for phase ID, quantification, micro-structure analysis and crystal structure refinement/determination