facts_xps

XPS Kratos AXIS Supra

FACST XPS room at N4.1 B4-10

X-ray Photoelectron Spectroscopy (XPS)

X-ray photoelectron spectroscopy (XPS), also known as electron spectroscopy for chemical analysis (ESCA), is a mature and widely used surface analysis technique for materials characterisation. XPS provides quantitative elemental and chemical state information from the upper most 10 nm of material. The technique is used in many diverse applications, ranging from multilayer coatings on architectural glazing to drug-eluting thin films in the pharmaceutical industry.
facts_XPS_diagram
  • Automated sample magazine (up to 3 large sample holders)
  • Large 500 mm Rowland circle monochromator
  • 180° hemispherical analyser (HSA) for spectroscopy mode and spherical mirror analyser (SMA) for parallel-imaging mode
  • Multichannel plate array with delay-line detector (DLD) for photoelectron counting
  • Integral charge neutraliser for a wide range of insulating samples
  • Attachments: ISS, ultraviolet lamp He I/He II discharge for UPS, sample heating and cooling (–100 °C to +800 °C)
  • XPS analysis of surfaces
  • In-situ heating-cooling
  • UPS analysis of surfaces
  • Chemical mapping
  • Depth-profile analysis