Thermionic SEM JEOL JSM 5410LV

FACTS N4.1 B4-10

SEM for imaging at high magnification and high depth of field

It is equipped with an EDX detector for elemental composition analysis
An SEM equipped with a thermionic electron gun
Resolution: 4.0nm
Accelerating Voltage: 0.5 to 30 kV
Magnification: 50x to 100,000x
Electron source: Thermionic tungsten filament
X-ray Analysis: Oxford INCA tower

The JSM-5410LV can be used as an imaging tool.

Human hair

 

Pollen