JEOL ARM200

ACTEM JEOL JEM-ARM200F

FACTS ABN B4

Aberration corrected transmission electron microscope with EDX

The JEM-ARM200F is a 200kV cold field-emission probe-corrected transmission electron microscope with a STEM resolution of 0.078 nm and TEM resolution of 0.1 nm. It also has an energy-dispersive X-ray detector that can form elemental maps at atomic resolution and a fast CMOS camera. With its probe aberration corrector and high-resolution pole-piece it is particularly suited to STEM imaging and analysis.

In TEM mode the specimen is illuminated with a parallel beam of electrons. The transmitted electrons are magnified using magnetic lenses and imaged on a CMOS camera. In STEM mode the electrons are focussed to a fine probe and scanned across the specimen. Signals such as the transmitted electrons or scattered electrons (HAADF) are recorded as the beam scans.
 80 kV200 kV
TEM information limit 0.189 nm
STEM HAADF resolution0.136 nm0.078 nm
STEM aberration-free angle37 mrad40 mrad

 

Features
  • Gatan 4k × 4k One-View CMOS camera
  • Oxford X-Max TLE 100 mm2 (~0.7 sr) windowless SDD EDX
  • High-angle annular dark-field, annular bright-field and bright-field STEM detectors
  • Atomic resolution imaging
  • EDX elemental composition analysis
  • Low (80kV) and high (200kV) operation