CICS, Centre for Integrated Circuits and Systems is an IC centre of international standing, equipped with state-of-the-art Electronic Design Automation (EDA) tools and measuring equipment.  The state-of-the-art EDA tools include comprehensive suites of Cadence, Mentor Graphics, Synopsys, Agilent, Ansys, etc. tools for a myriad of technologies, including CMOS and III/V, and esoteric tools to simulate the effects of radiation, etc.   The state-of-the-art measurement equipment includes a myriad of standard measurement instruments and a High-Frequency Characterization Room equipped with a 12” Probe System and an Integrated Characterization and Analysis System.  This system, only one of very few in the world, facilitates on-wafer S-parameter RF/mm-wave device characterization from DC to 325 GHz, high frequency noise measurement from 0.3 MHz to 67 GHz and flicker noise measurement up to 40 MHz.

The 140GHz I/O Characterization System and 63GHz (160GS/s) Oscilloscope, this equipment to build a whole high-speed device and I/O testing system, can perform many fundamental research and engineering works to study plasmonic device physics and also develop plasmonic circuit applications, would enhance the high-speed and high frequency testing facility in Singapore.

All the equipment at CICS are open to public and accept advanced booking to use (Terms and conditions apply). ​