From left: Assoc Prof Tan Rui, Dr Le Van Duc, Mr Chen Jiale, and Mr Daren Ho (HP Inc., Singapore)
The HP-NTU Corp Lab research team (Mr Chen Jiale and Dr Le Van Duc) led by Assoc Prof Tan Rui from School of Computer Science and Engineering and Mr Daren Ho from HP Inc., Singapore won the Best Paper Award from the 14th ACM/IEEE International Conference on Cyber-Physical Systems (ICCPS) for the paper titled “BubCam: A Vision System for Automated Quality Inspection at Manufacturing Lines”. The award winner is selected from 21 accepted papers among 82 submissions by an award committee consisting of multiple distinguished senior members in the Cyber-Physical System (CPS) community.
The team has designed and implemented a smart collaborative camera system for automated quality inspection of manufactured ink bags in HP Inc.'s factories in Singapore. The designed camera system uses various deep learning (DL)-based image segmentation and depth fusion techniques to achieve satisfactory inspection performance under the dynamic ambient light reflection condition of the industrial environment. The system is extensively evaluated via both controlled lab and factory experiment trials, and can obtain significant performance improvement, compared with the existing inspection approaches.
BubCam: A Vision System for Automated Quality Inspection at Manufacturing Lines
Paper link: https://dl.acm.org/doi/10.1145/3576841.3585926
ACM/IEEE ICCPS is the premier forum for presenting and discussing the most significant recent technical research contributions in the field of CPS. It is a module conference of CPS-IoT Week 2023 which was held from 09 to 12 May 2023 in San Antonio, Texas, USA.
Conference link: https://iccps.acm.org/2023/index.html
News article published in School of Computer Science and Engineering: