Thermionic SEM JEOL JSM-6360

FACTS N4.1 B4-10

SEM for imaging and composition analysis using EDX

It is also equipped with an EDX detector for elemental composition analysis
An SEM equipped with a thermionic electron gun
Resolution: 4.0nm
Accelerating Voltage: 0.5 to 30 kV
Magnification: 50x to 100,000x
Electron source: Thermionic tungsten filament
X-ray Analysis: JEOL JED-2300

The JSM 6360 is used as an imaging tool.

Secondary electron images of nanospherical oxides