Thermionic SEM JEOL JSM 5500LV

FACTS N4.1 B4-10

SEM for imaging at high magnification and depth of field

It is also equipped with an EDX detector for elemental composition analysis
An SEM equipped with a thermionic gun
Resolution: 4.0nm
Accelerating Voltage: 0.5 to 30 kV
Magnification: 50x to 100,000x
Electron source: Thermionic tungsten filament
X-ray analysis: Oxford INCA tower
  • SEM imaging
  • EDX analysis