MBE

MBE

 

 

Cypher Scanning Probe Microscope

 

Cypher Scanning Probe Microscope

 

 

Video Contact Angle

Video Contact Angle

  

 

SEM

SEM

 

 

DTG

DTG

 

 

FT-IR

FT-IR
 
200mm Wafer Probe Station and Electrical Measurement Setup
200mm Wafer Probe Station and Electrical Measurement Setup
 

Ultra-High Vacuum Conductive Atomic Force Microscope

Ultra-High Vacuum Conductive Atomic Force Microscope
​LaboratoriesLocation​​Telephone
​Characterization​S1-B2c-20/21​6790 5479/5477
​Device Fabrication Simulation Laboratory​​S2-B5a-01​6790 6407/6393
​Nanoelectronics I​​S1-B3a-01​6790 5454
​​Nanoelectronics II​​S1-B4a-01​6790 5454
Nanomaterials LaboratoryS21-B5-01​6790 4548
​Semiconductor Characterization Laboratory​​S1-B3c-27a 
 
Contact Information:

To know more on the Centre Facilities/Laboratories, please contact our Research Centre's Cluster Manager, Chan Kar Sing (Email:[email protected], Tel: 6790 5477)

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