Chemical and Elemental Analysis

• Elemental Analysis (CHN/CHNS)
• ICP/OES
• XPS

Materials Studies & Diffraction Analysis

• X-Ray Diffraction
  
• Dynamic Light Scattering (DLS)
  
• Contact Angle measurements

Microscopic Analysis

• Atomic Force Microscope (AFM)
• Electron Microscope (SEM/TEM)

Spectroscopic Analysis

• Confocal Raman Spectroscopy
  
• Mass Spectrometry (MS)
• Nuclear Magnetic Resonance (NMR)

Others

• Lab Supplies
• Poster Printing
  

Safety Training and Lab Access Application

• Lab Access Application

• Atomic and Nanoscale Imaging/Microscopy
• Spectrometry
• Crystal Structures, Particle Size, and Surface Area Analysis

• Thermal and Mechanical Analysis
• Chromatography and Mass Spectroscopy​​
• Sample Preparation
  

• Central Equipment Usage Rules​​
• Central Equipment Usage Rates
• Working After Office Hour Usage Rules​

• CCEB Nanyang Drive Central Equipment Training Request Form
• Equipment Usage Charge Form
• Mechanical Workshop Work Order Form
• CCEB Security Access Application Form
• Working After Office Hours Request Form