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Tony
Tae-Hyoung Kim (Ph.D 2009)
Assistant
Professor
thkim@ntu.edu.sg
Tel. - 65-6790-4001 (Office)
Ph.D University of Minnesota, 2009
M.S. Korea University, 2001
B.S.
Korea University, 1999
05/2009 ~ 08/2009,
Broadcom, USA
06/2008 ~ 08/2008, IBM T. J. Watson Research Center, USA
05/2007 ~ 08/2007, IBM T. J. Watson Research Center, USA
02/2001 ~ 06/2005, Samsung Electronics, Korea |
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Prof. Tony T. Kim received the B.S. and M.S. degrees in
electrical engineering from Korea University, Seoul, Korea, in 1999 and 2001, respectively. He received the Ph.D. degree in electrical
and computer engineering from University of Minnesota, Minneapolis, MN, USA
in 2009. From 2001 to 2005, he worked for Samsung Electronics where he
performed research on the design of high-speed SRAM memories, clock
generators, and IO interface circuits. In 2007 ~ 2009 summer, he was with IBM T. J. Watson Research Center and Broadcom Corporation where he performed
research on isolated NBTI/PBTI measurement circuits and SRAM Mismatch measurement
test structure, and battery backed memory design, respectively. In November
2009, he joined Nanyang Technological
University as an assistant professor.
He
received 2008 AMD/CICC Student Scholarship Award, 2008 Departmental
Research Fellowship from U. of Minnesota, 2008 DAC/ISSCC Student Design
Contest Award, 2008 Samsung Humantec Thesis Award (Bronze Prize), 2005 ETRI
Journal Paper of the Year Award, 2001 Samsung Humantec Thesis Award (Honor
Prize), and 1999 Samsung Humantec Thesis Award (Silver Prize). He is an
author/coauthor of around 30 journal and conference papers and
has 18 US and Korean patents registered and in
pending. His current
research interests include low power and high performance digital, mixed-mode,
and memory circuit design, ultra-low voltage sub-threshold circuit design
for energy efficiency, variation and aging tolerant circuits and systems, and
circuit techniques for 3D ICs. Prof. Kim is a member of IEEE. He also serves as a paper reviewer
of various journals and conferences such as IEEE J. of Solid-State Circuits
(JSSC), IEEE Trans. on VLSI Systems (TVLSI), IEEE Trans. on
Circuits and Systems II (TCAS-II), IEEE Trans. on Biomedical
Circuits and Systems (TBCAS), J. of Circuits, Systems, and
Computers (JCSC), J. of Low Power Electronics (JOLPE), Design Automation Conference (DAC),
International Conference on Computer Aided Design (ICCAD), International Symposium on Low Power Electronics and Design (ISLPED),
Asia Symposium on Quality Electronic Design (ASQED), and International Symposium on Integrated Circuits (ISIC). |