Z. H. Chen, X. Zhou, Y. Z. Hu, and M. K. Srikanth,
"Neutral Interface Traps for Negative Bias Temperature Instability," Proc.
of the 2011 IEEE Reliability Physics Symposium (IRPS2011),
Monterey, CA, Apr. 2011, pp. 913-914.
Z. H. Chen, X. Zhou, G. J. Zhu, and S. H. Lin, "Interface-Trap
Modeling for Silicon-Nanowire MOSFETs," Proc.
of the 2010 IEEE Reliability Physics Symposium (IRPS2010),
Anaheim, CA, May 2010, pp. 977-980.
X. Zhou, G. J. Zhu, S. H. Lin, Z. H. Chen, M. K.
Srikanth, Y. F. Yan, R. Selvakumar, W. Chandra, J. B. Zhang, C. Q. Wei,
Z. H. Wang, and P. Bathla, "Subcircuit Approach to Inventive Compact Modeling
for CMOS Variability and Reliability," Proc.
of the 12th International Symposium on Integrated Circuits, Devices &
Systems (ISIC2009),
Singapore, Dec. 2009, pp. 133-138.
G. J. Zhu, X. Zhou, Y. K. Chin, K. L. Pey, G. H.
See, S. H. Lin, and J. B. Zhang, “Subcircuit Compact Model for Dopant-Segregated
Schottky Silicon-Nanowire MOSFETs,” Proc.
of the 2009 International Conference on Solid State Devices and Materials
(SSDM2009),
Miyagi, Japan, Oct. 2009, pp. 402-403.
X. Zhou, G. J. Zhu, G. H. See, J. B. Zhang, S. H.
Lin, C. Q. Wei, Z. H. Chen, M. K. Srikanth, Y. F. Yan, R. Selvakumar, and
W. Chandra, “Unified Compact Modeling for Bulk/SOI/FinFET/SiNW MOSFETs,”
(Invited
Paper), Proc. of the 2nd International
Workshop on Electron Devices and Semiconductor Technology (IEDST2009),
Mumbai, India, June 2009, Paper
I8.
X. Zhou, G. J. Zhu, M. K. Srikanth, R. Selvakumar,
Y. F. Yan, W. Chandra, J. B. Zhang, S. H. Lin, C. Q. Wei, and Z. H. Chen,
"Compact Model Application to Statistical/Probabilistic Technology Variations,"
Proc.
of the 12th International Conference on Modeling and Simulation of Microsystems
(WCM-Nanotech2009), Houston, TX, May 2009,
pp. 612-615.
"Neutral Interface Traps for Negative Bias Temperature
Instability," 2011 IEEE Reliability Physics
Symposium (IRPS2011),
Monterey, CA, Apr. 13, 2011.
"A Unified Compact Model for Emerging DG FinFETs
and GAA Nanowire MOSFETs Including Long/Short-Channel and Thin/Thick-Body
Effects," (Invited Paper), the 10th
International Conference on Solid-State and Integrated-Circuit Technology
(ICSICT2010),
Shanghai, China, Nov. 2, 2010.
"Unification of MOS Compact Models with the Unified
Regional Modeling Approach," Invited Talk
(IEEE EDS Distinguished Lecture Program),
UC San Diego, June 25, 2010.
"Subcircuit Approach to Inventive Compact Modeling
for CMOS Variability and Reliability," the
12th International Symposium on Integrated Circuits, Devices & Systems
(ISIC2009),
Singapore, Dec. 15, 2009.
"Unification of MOSFET Compact Models with the Unified
Regional Modeling Approach," (Invited Talk), MOS-AK
Workshop, Baltimore, MD, Dec. 9, 2009.
"Compact Model Application to Statistical/Probabilistic
Technology Variations," Invited Talk,
Indian Institute of Technology - Bombay, Mumbai, Nov. 20, 2009.
"Compact Model Application to Statistical/Probabilistic
Technology Variations," Invited Talk,
Technical University of Munich, Germany, Oct. 13, 2009.
"Compact Model Application to Statistical and Probabilistic
Technology Variations," Invited Talk,
Workshop on Sustainable Nanoelectronics and Information Technology, Rice
Univ., Houston, TX, June 24, 2009.
"Unified Compact Modeling for Bulk/SOI/FinFET/SiNW
MOSFETs," the 2nd International Workshop
on Electron Devices and Semiconductor Technology (IEDST2009),
Mumbai, India, June 2, 2009.
"Compact Model Application to Statistical/Probabilistic
Technology Variations," the 12th International
Conference on Modeling and Simulation of Microsystems (WCM-Nanotech2009),
Houston, TX, May 6, 2009.
"Unified Compact Modeling of Emerging Multiple-Gate
MOSFETs," Invited Talk (IEEE EDS Distinguished
Lecture Program), Sematech, Austin, TX,
Aug. 7, 2008.